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Patents Held by Sciaky, Inc

Backscatter Detection; Electron Beam Layer Manufacturing Using Scanning Electron Monitored Closed Loop Control

  • 8,598,523 (US)
  • 8,809,780 (US)
  • 2010318559 (AU)
  • 2498935 (EP)
  • 2498935 (DE)
  • 2498935 (FR)
  • 2498935 (GB)

CLC Camera; Electron Beam Layer Manufacturing

  • 8,546,717 (US)
  • 2010295585 (AU)
 

Dynamic Raster; Raster Methodology, Apparatus, and System for Electron Beam Layer Manufacturing Using Closed Loop Control

  • 8,461,474 (US)
  • 9,174,300 (US)

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Sciaky wins TCT Aerospace Application Award for EBAM® Metal 3D Printing Technology The award acknowledges the significant tim...

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Sciakys neue Website präsentiert auch ein erweitertes Portfolio mit neuen 3D-Metalldrucksystemen Chicago, Illinois, USA -...