Since 1939

Patents

Contact Us

Patents Held by Sciaky, Inc

Backscatter Detection; Electron Beam Layer Manufacturing Using Scanning Electron Monitored Closed Loop Control

  • 8,598,523 (US)
  • 8,809,780 (US)
  • 2010318559 (AU)
  • 2498935 (EP)
  • 2498935 (DE)
  • 2498935 (FR)
  • 2498935 (GB)

CLC Camera; Electron Beam Layer Manufacturing

  • 8,546,717 (US)
  • 2010295585 (AU)
 

Dynamic Raster; Raster Methodology, Apparatus, and System for Electron Beam Layer Manufacturing Using Closed Loop Control

  • 8,461,474 (US)
  • 9,174,300 (US)

Latest News:

Sciaky wins TCT Aerospace Application Award for EBAM® Metal 3D Printing Technology The award acknowledges the significant tim...

西亚基新闻

西亚基还在新网站上公布了经过扩充的全新金属 3D 打印系统产品系列 伊利诺伊州芝加哥 - Phillips...